Project: Metrology with/for NEMS
Industry demands increasing complexity, speed and performance from devices, as well as a reduction in size. Nano-electro-mechanical systems (NEMS) devices integrate electrical or mechanical functionality at the nanoscale level and are a key disruptive technology that could potentially provide solutions to a range of technological barriers, from electronics and computing, to physical and biological sensors. As the dimensions of devices are reduced, new technologies and approaches are needed, however NEMS has not yet been exploited to meet these needs. This project will develop precise and traceable measurements of physical parameters such as mass, force, displacement and temperature, as well as single photon and single molecule measurement, at the nanoscale level. It will also investigate new materials such as graphene and piezoelectrics to develop high performance NEMS.
| Acronym | NEW08 MetNEMS (Reference Number: NEW08) |
| Duration | 01/08/2012 - 31/07/2015 |
| Project Topic | Metrology |
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Project Results (after finalisation) |
See Website |
| Website | visit project website |
| Network | EMRP |
| Call | EMRP Call 2011 - Health, SI Broader Scope and New Technologies |